Snapshot provides a quick and easy way to summarize the contents of a Result Set or Work File. It offers an efficient way to analyze your search results, as well as a way to refine your results for more targeted research. With Snapshot, you can focus your search efforts and find the data that's most relevant to you.

For example, you can use Snapshot with your Result Set or Work File to see which companies hold the most patents in a specific area or who the top inventors are and where they reside. Or, you can summarize by IPC code and get a quick picture of how many patents are being filed each year for a given technology.

Application Year Application Year/     Month Assignee Assignee City Assignee State Assignee Country Attorney

Designated Countries Inventor Inventor City Inventor State Inventor Country IPC - 4 digit IPC - Full

Issue Year Issue Year/Month Parent Company Priority Year Priority Year/Month Unified Company Ultimate Company

US Assignee Code US Class - 3 digit US Class - Full US Examiners US Forward References US Maint. Status US References

Once you've conducted an initial analysis with Snapshot, you can use the tool to dive even deeper into the data — and glean additional insights:

• You can do a new analysis on a subset of categories selected from your initial analysis. For example, from the bar chart summary, you can select the top assignees and rerun the analysis on your selected group.
• You can refine your search by zeroing in on subsets of patents. Click on any item in your summary, or select multiple items across categories, and instantly view the list of patents associated with them.

Snapshot is easy to use and flexible. It enables you to summarize the data using multiple bibliographic fields at once. You can also specify exactly how you want the data presented by setting display parameters and the way you want your summary results sorted.

Snapshot is free for Delphion Unlimited subscribers, and $15 per day for Delphion Premier subscribers.